NDLI: Robust System Design to Overcome CMOS Reliability Challenges

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Robust System Design to Overcome CMOS Reliability Challenges

Content Provider	IEEE Xplore Digital Library
Author	Mitra, S. Brelsford, K. Young Moon Kim Hsiao-Heng Kelin Lee Yanjing Li
Copyright Year	2011
Abstract	Today's mainstream electronic systems typically assume that transistors and interconnects operate correctly over their useful lifetime. With enormous complexity and significantly increased vulnerability to failures compared to the past, future system designs cannot rely on such assumptions. For coming generations of silicon technologies, several causes of hardware reliability failures, largely benign in the past, are becoming significant at the system level. Robust system design is essential to ensure that future systems perform correctly despite rising complexity and increasing disturbances. This paper describes three techniques that can enable a sea change in robust system design through cost-effective tolerance and prediction of failures in hardware during system operation: 1) efficient soft error resilience; 2) circuit failure prediction; and 3) effective on-line self-test and diagnostics. The need for global optimization across multiple abstraction layers is also demonstrated.
Starting Page	30
Ending Page	41
Page Count	12
File Size	1401910
File Format	PDF
ISSN	21563357
Volume Number	1
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Resilience Robustness Transistors CMOS integrated circuits Layout Hardware soft error Built-In Soft Error Resilience (BISER) Concurrent Autonomous chip self-test and diagnostics using Stored test Patterns (CASP) circuit failure prediction diagnostics Layout design through Error-Aware transistor Positioning (LEAP) on-line self-test reliability resilience robust system
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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