Loading...
Please wait, while we are loading the content...
Estimation of Charge Injection Barrier at Organic Semiconductor/Metal Interface Using Accumulated Charge Measurement Technique
Content Provider | Semantic Scholar |
---|---|
Author | Tajima, Hiroyuki Tomofumi, Kadoya Seiichi, Sato Masato, Otsuka Akinari, Ogino Tokuji, Yokomatsu Kazusuke, Maenaka Jyun-Ichi, Yamada |
Copyright Year | 2017 |
Abstract | Estimation of Charge Injection Barrier at Organic Semiconductor/Metal Interface Using Accumulated Charge Measurement Technique 兵庫県大院物質理 1, 兵庫県大院工 2, 田島 裕之 1, 角屋 智史 1, 佐藤 井一 1, 大塚 理人 1, 荻野 晃成 1, 横松 得滋 2, 前中 一介 2, 山田 順一 1, Graduate School of Material Science University of Hyogo.1, Graduate School of Engineering University of Hyogo.2,Hiroyuki Tajima1, Tomofumi Kadoya1, Seiichi Sato1, Masato Otsuka1, Akinari Ogino1, Tokuji Yokomatsu2, Kazusuke Maenaka2, Jun-ichi Yamada1 E-mail:tajima@sci.u-hyogo.ac.jp |
File Format | PDF HTM / HTML |
Alternate Webpage(s) | https://confit.atlas.jp/guide/event-img/jsap2017a/7p-A504-12/public/pdf?type=in |
Language | English |
Access Restriction | Open |
Content Type | Text |
Resource Type | Article |