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Silicon Carbide Junction Field Effect Transistor Digital Logic Gates Demonstrated at 600 deg. C
| Content Provider | Semantic Scholar |
|---|---|
| Author | Neudeck, Philip G. |
| Copyright Year | 1998 |
| Abstract | Complex electronics and sensors are increasingly being relied on to enhance the capabilities and efficiency of modern jet aircraft. Many of these electronics and sensors monitor and control vital engine components and aerosurfaces that operate at high temperatures. However, since today's silicon-based electronics technology cannot function at high temperatures, these electronics must reside in environmentally controlled areas. This necessitates either the use of long wire runs between sheltered electronics and hotarea sensors and controls, or the fuel cooling of electronics and sensors located in hightemperature areas. Both of these low-temperature-electronics approaches suffer from serious drawbacks in terms of increased weight, decreased fuel efficiency, and reduction of aircraft reliability. A family of high-temperature electronics and sensors that could function in hot areas would enable substantial aircraft performance gains. Especially since, in the future, some turbine-engine electronics may need to function at temperatures as high as 600 °C. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://ntrs.nasa.gov/archive/nasa/casi.ntrs.nasa.gov/20050180654.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |