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Caractérisation des circuits intégrés micro-onde à base d'Arséniure de Gallium par sondage électro-optique utilisant un faisceau laser continu
| Content Provider | Semantic Scholar |
|---|---|
| Author | Lauffenburger, Stéphane |
| Copyright Year | 2003 |
| Abstract | The number of integrated circuit (IC) type "Microwave Monolithic Integrated Circuits" (MMIC) increased with the number of systems operating at higher frequencies. For a better design, it is important to possess probing tools for the characterization of the IC. In this Ph. D. Thesis, we concentrate on the probing of MMIC made of Gallium Arsenide. A laser beam is focused onto the IC under test. The beam enters the substrate and it will be reflected from the backside of the IC. The reflected laser beam is modulated by the electro-optic effect. By measuring this modulation, we can determine the wanted microwave signal. This work describes the development of prototype and the obtained results. The setup of the tool is simple because of the use of optical fiber and inexpensive. We analyze the theoretical (dependency of the optical axes on the microwave field) and technical (variation of the polarization and intensity of the laser and the beam divergence) problems of this probing technique. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://pastel.archives-ouvertes.fr/pastel-00000621/document |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
