NDLI: Spin-polarized scanning electron microscopy.

Content Provider	Semantic Scholar
Author	Koike, Kazuyuki Suginami-ku
Copyright Year	2013
Abstract	Spin-polarized scanning electron microscopy (spin-SEM) is a magnetic domain observation method. In spin-SEM, polarization of secondary electrons emitted from a sample in a scanning electron microscope is detected by a spin detector and used as a signal for forming an image. The characteristics of spin-SEM are detection of all three magnetization vector components, which leads to the detection of the magnetization vector direction, high spatial resolution of around 3 nm and applicability to samples with rough or even 3D surfaces. Spin-SEM combined with other imaging methods using an electron probe beam such as scanning Auger electron microscopy for imaging element distribution and electron backscattering diffraction microscopy for imaging crystal direction distribution provides additional information that is important to study the magnetism. Spin-SEM with these excellent characteristics has a broad range of applications from basic research to applied research and developments in various industries.
Starting Page	529
Ending Page	529
Page Count	1
File Format	PDF HTM / HTML
Alternate Webpage(s)	https://watermark.silverchair.com/dfs092.pdf?token=AQECAHi208BE49Ooan9kkhW_Ercy7Dm3ZL_9Cf3qfKAc485ysgAAAkUwggJBBgkqhkiG9w0BBwagggIyMIICLgIBADCCAicGCSqGSIb3DQEHATAeBglghkgBZQMEAS4wEQQMurcKlJGlvBOkRWedAgEQgIIB-HU1AgGtKGIKi3MHgMm9rXw2aVAYtVfaMokh-hp32xUZGQAszFK6WkhkjzJGnEdjDSrQLXo-JdDe9dpT7Wah9-1VU0Kni7XaTkjJ8lfN4E6i37dRIOwa-yyPqDw36p_3-rnPdgutJGcQxZqeuD1JXiZOgvwNG0XX68NFtse7mrPddgOPF43bc42O2YC32KNFd1YT88fbGg9ftrqQRzeyWQIJrmpQabcWUMzojvc5GEY42JTsT7uNZYufUJT-ryBb4nwd1CYQsUb48Ltl_-Nc3BsImMM-TL31vNPZvIaV9FryS5nzMubZrAw5P3LgesEE-xTRuO2edmPXCmfUPB5adnRi3X1z-Y66odsFeA8vAZ0r6SmErez2Oemfh4JtcGZifRGA9FbLLUoxCLcHkNqxcsmZSfgdnkjVE2Y9rTfJFQl1bh5maDh6p4fJDrqImQk9ruTOSXaZc2PGkV2pSLcPnX1i95uMbWjsQTo2N7DTdAxQXRTqTVrM3AwZOOYYoe2Hr2EvABiH0B0YikTGdwH-D61ODOehdy2djEzV-91jSKZ3drCPkuR3iJCwY5E3luCGKB7nEub2l5kEOc1TzfvgiUDrE9pbJBouXGdwOXVxbtDPXrtyk_8PE7fQE9-hm7uXm7TxgIuJ1AjvAX5B8Eydm2jkXH9FQa3waA
PubMed reference number	23325928v1
Alternate Webpage(s)	https://doi.org/10.1093/jmicro/dfs092
DOI	10.1093/jmicro/dfs092
Journal	Microscopy
Volume Number	62
Issue Number	1
Language	English
Access Restriction	Open
Subject Keyword	Detectors Electrons Magnetism Microscope Device Component Microscopes, Electron, Scanning Scanning Electron Microscopy applied research electron microscope
Content Type	Text
Resource Type	Article

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