Loading...
Please wait, while we are loading the content...
Beem: a Probe of Nanoscale Modification
| Content Provider | Semantic Scholar |
|---|---|
| Copyright Year | 2004 |
| Abstract | Hot electrons injected by a scanning tunneling microscope (STM) tip with a few volts tunneling bias scatter and modify a gold film not only at the top surface of the film, but throughout the film and at the inner or interfacial surface. The ballistic electron emission microscopy (BEEM) measurement technique is a powerful method with which one can probe such modifications. In particular, the production of adatoms and their subsequent coagulation into atomic terraces on the inner surface of the gold is demonstrated. Quantitative measurements of the adatom production rate are in good agreement with that predicted by a model including bond breaking by the hot electrons. The stability of the created structures is shown to be related to the physical properties of the gold film. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://www.physics.ncsu.edu/optics/papers/BEEM_Avouris1993.pdf |
| Language | English |
| Access Restriction | Open |
| Subject Keyword | Electron Electrons Microscope Device Component Microscopy, Scanning Tunneling Physical Phenomenon or Property Scanning Tunneling Microscopes (device) Tunneling protocol Volt |
| Content Type | Text |
| Resource Type | Article |