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Spectroscopic ellipsometry study of epitaxially grown Pb „ Mg 1 Õ 3 Nb 2 Õ 3 ... O 3 – PbTiO 3 Õ MgO Õ TiN Õ Si heterostructures
| Content Provider | Semantic Scholar |
|---|---|
| Author | Tsang, Wing Shan Chan, King Yuk Wong, K. H. |
| Copyright Year | 2003 |
| Abstract | 0.65Pb~Mg1/3Nb2/3)O3– 0.35PbTiO3 ~PMN–PT! thin films have been grown on MgO/TiN-buffered Si~001! substrates using pulsed laser deposition. Their structural properties and surface morphology were examined by x-ray diffraction and scanning electron microscopy, respectively. All PMN–PT films grown at 670 °C show a cube-on-cube epitaxial relationship of PMN– PT~100!iMgO~100!iTiN~100!iSi~100!. Discernable interfaces between layers in the heterostructures and crack-free surfaces are evident. A spectroscopic ellipsometer was used to study the optical characteristics of the films. It was revealed that the refractive index of the PMN–PT is ;2.50 as measured at 635 nm. This value is only slightly less than that of the PMN–PT single crystal of 2.60. Our results suggest that the PMN–PT/MgO/TiN/Si heterostructure has an excellent potential for use in integrated optical waveguide devices. © 2003 American Institute of Physics. @DOI: 10.1063/1.1603339 # |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://ira.lib.polyu.edu.hk/bitstream/10397/4229/1/Tsang_Epitaxially_Grown_Heterostructures.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
