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Polarization Fatigue in Pb(In(0.5)Nb(0.5))O(3)-Pb(Mg(1/3)Nb(2/3))O(3)-PbTiO(3) Single Crystals.
| Content Provider | Semantic Scholar |
|---|---|
| Author | Zhang, Shujun Meyer, Richard J. Hackenberger, Wesley Shrout, Thomas R. |
| Copyright Year | 2010 |
| Abstract | Electric fatigue tests have been conducted on pure and manganese modified Pb(In(0.5)Nb(0.5))O(3)-Pb(Mg(1/3)Nb(2/3))O(3)-PbTiO(3) (PIN-PMN-PT) single crystals along different crystallographic directions. Polarization degradation was observed to suddenly occur above 50-100 bipolar cycles in <110> oriented samples, while <001> oriented samples exhibited almost fatigue free characteristics. The fatigue behavior was investigated as a function of orientation, magnitude of the electric field and manganese dopant. It was found that <001> oriented PIN-PMN-PT crystals were fatigue free, due to its small domain size, being on the order of 1µm. The <110> direction exhibited a strong electrical fatigue behavior due to mechanical degradation. Micro/macro cracks were developed in fatigued <110> oriented single crystals. Fatigue and cracks were the results of strong anisotropic piezoelectric stress and non-180° domain switching, which completely locked the non-180° domains. Furthermore, manganese modified PIN-PMN-PT crystals were found to show improved fatigue behavior due to its enhanced coercive field. |
| Starting Page | 3773 |
| Ending Page | 3780 |
| Page Count | 8 |
| File Format | PDF HTM / HTML |
| PubMed reference number | 20652090 |
| Journal | Medline |
| Volume Number | 58 |
| Issue Number | 10 |
| Alternate Webpage(s) | http://wwwarchive.math.psu.edu/cao/Papers_PDF/NIH2010/PIN-Acta%20Materialia.pdf |
| Journal | Acta materialia |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
