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EPC eGaN FETs Reliability Testing - Phase 6
| Content Provider | Semantic Scholar |
|---|---|
| Author | Strittmatter, Rob Zhou, Chunhua Ma, Yanping |
| Copyright Year | 2014 |
| Abstract | In the first section, we report on the successful completion of automotive AEC-Q101 qualification on four new automotive eGaN® products, with several more in the pipeline for release. AEC-Q101 demands the highest level of reliability standards for power FETs, requiring not only zero datasheet failures, but also low parametric drift during stress testing. We present in detail the test matrix that was completed to achieve this qualification. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://epc-co.com/epc/Portals/0/epc/documents/product-training/Reliability%20Report%20Phase%2010.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |