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Core-state manipulation of single Fe impurities in GaAs with a scanning tunneling microscope
| Content Provider | Semantic Scholar |
|---|---|
| Author | Bocquel, Juanita Kortan, Victoria Sahin, Cuneyt Campion, Richard P. Gallagher, B. L. Flatté, Michael E. Koenraad, Pm Paul |
| Copyright Year | 2013 |
| Abstract | We demonstrate that a scanning tunneling microscope tip can be used to manipulate the tightly bound core (d-electron) state of single Fe ions embedded in GaAs. Increasing tip-sample voltage removes one d electron from the core of a single Fe, changing the dopant from the (Fe2+)(-) ionized acceptor state to the (Fe3+)(0) isoelectronic state, which alters the spin moment and dramatically modifies the measured local electronic contrast in topographic maps of the surface. Evidence of internal transitions among the d states of the Fe core is also seen in topographic maps where dark anisotropic features emerge from the interference between two paths: the direct tip-sample tunneling and tunneling which excites a d-state core exciton of the Fe dopant. |
| Starting Page | 075421 |
| Ending Page | 075421 |
| Page Count | 1 |
| File Format | PDF HTM / HTML |
| DOI | 10.1103/PhysRevB.87.075421 |
| Volume Number | 87 |
| Alternate Webpage(s) | https://pure.tue.nl/ws/files/3670043/373383809815813.pdf |
| Alternate Webpage(s) | http://myweb.uiowa.edu/csahin/files/2013_1.pdf |
| Alternate Webpage(s) | https://doi.org/10.1103/PhysRevB.87.075421 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
