Loading...
Please wait, while we are loading the content...
Similar Documents
Characterization of SiO 2 Nanoparticles by Single Particle-Inductively Coupled Plasma – Tandem Mass Spectroscopy
| Content Provider | Semantic Scholar |
|---|---|
| Author | Diego Pereira Leite A. Bolea-Fernandezb, Eduardo Rua-Ibarz, Ana Martín Resano A. Frank Vanhaecke B. Maite Aramendía A. |
| Copyright Year | 2017 |
| Abstract | This work uses the tandem ICP-MS (ICPMS/MS) for obtaining interference-free conditions to characterize SiO2 nanoparticles ranging between 80 and 400 nm. These NPs have been detected and accurately characterized. For SiO2 NPs > 100 nm, it was possible to provide accurate results in a straightforward way, as their signal distributions are well resolved from that of the background. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://papiro.unizar.es/ojs/index.php/jji3a/article/download/1962/1847 |
| Language | English |
| Access Restriction | Open |
| Subject Keyword | Eighty Gas Chromatography-Mass Spectrometry Inductively-Coupled Plasma Mass Spectrometry Interference (communication) |
| Content Type | Text |
| Resource Type | Article |