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LSI/Microprocessor Reliability Prediction Model Development.
| Content Provider | Semantic Scholar |
|---|---|
| Author | Rickers, H. C. |
| Copyright Year | 1979 |
| Abstract | Abstract : This report presents updated reliabilty prediction models for LSI, microprocessor and memory devices for inclusion in MIL-HDBK-217B, 'Reliability Prediction of Electronic Equipment'. The models proposed in this study possess all those qualities common to practical reliability assessment techniques. The expressions are relatively simple and allow for consideration of evolving fabrication techniques, or emerging technologies, through the modification of temperature dependency and associated temperature factors. The factors exhibit the appropriate discriminations against the device design and usage attributes which contribute to known failure mechanisms. Additionally, each of the models demonstrate reasonable accuracy over the total range of parameters considered in these techniques. (Author) |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://www.theriac.org/informationresources/demosanddownloads/Unlimited%20Distribution/LSI%20Microprocessor%20Rel%20Pred%20Model%20Dev%20ADA068911.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
