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Indium Tin Oxide thin films deposited on glass substrate for photovoltaic application
| Content Provider | Semantic Scholar |
|---|---|
| Author | Kerkache, L. Layadi, A. Hadjersi, F. Dogheche, Elhadj Gokarna, Anisha Stolz, Arnaud Halbwax, Mathieu Vilcot, J. P. Decoster, Didier Zein, Bassel Habib, Sami S. |
| Copyright Year | 2010 |
| Abstract | Polycrystalline indium tin oxide (ITO) films were prepared on glass substrates by radio frequency (RF) sputtering system from a high density target (90wt. In 2O3 and 10 wt. %SnO2). X-ray diffraction (XRD) and Scanning Electron Microscopy (SEM) experiments were performed to study the structure and the surface morphology of these samples. The results show that the as-deposited ITO thin films deposited on glass have a <100> texture, as the film grows the preferred orientation changes from <100> to <111>. The lattice parameters are found to be larger than the bulk value, indicating that the samples are under a tensile stress. The grain size increases with increasing thickness. SEM images show a dense granular structure with grains having different shapes and sizes. After deposition, the samples have been annealed in air at temperature T around 400°C for 1 hour. We found that the <111> texture becomes stronger after the annealing treatment. A large increase in the grain size after annealing is also observed. The lattice constant decreases with T to become closer to the bulk value, i.e. annealing seems to relieve the stress present in the as-deposited films. The optical transmisión is greater than 80 % in the visible region.The refractive index n values are found to be in the 1.7-1.9 range. The energy gap values are between 3.58 and 3.88 eV . |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://www.icrepq.com/icrepq'10/720-Kerkache.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
