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Why Defects Escape Some of Our Tests
| Content Provider | Semantic Scholar |
|---|---|
| Author | McCluskey, Edward J. |
| Copyright Year | 2000 |
| Abstract | Incomplete Tests The first case occurs when the test patterns are not thorough enough, but it may be very difficult to determine how thorough the test patterns really are. As an example, let's consider testing of a combinational circuit — perhaps as part of an internal scan test. Further, suppose that the part was not to be operated at an aggressive speed so that delay fault testing was not necessary assuming that process drift was checked by some other means such as ring oscillators, etc. If we had generated a test set that had 100% single stuck fault coverage we would be confident that we were applying a very thorough test. Hidden in this confidence is the belief that the defects would not change the combinational circuit into a sequential circuit. How could this happen? One possibility is that a defect caused a bridging fault that inserted an asynchronous feedback loop into the circuit. Another, and probably much more likely explanation, is that a defect caused an open in the circuit. In our Murphy experiment [1], we found that 36 of the 116 defective chips exhibited sequence dependent behavior; that is, their output response changed if the order in which the inputs were applied was changed. One might think that the way to avoid this situation would be to apply a stuck-open test set; but in our experiment the stuck-open test set was very long and still missed many of the defective chips. There were several multiple-detect test sets that were shorter than the stuck-open test set and which detected all of the defective chips. |
| Starting Page | 1125 |
| Ending Page | 1125 |
| Page Count | 1 |
| File Format | PDF HTM / HTML |
| DOI | 10.1109/ITC.2000.10033 |
| Alternate Webpage(s) | https://www.computer.org/csdl/proceedings/itc/2000/6547/00/65471125.pdf |
| Alternate Webpage(s) | http://crc.stanford.edu/crc_papers/ejmitc00b.pdf |
| Alternate Webpage(s) | https://doi.org/10.1109/ITC.2000.10033 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
