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Ultralow Resistance Ohmic Contacts for p-Channel InGaSb Field-Effect Transistors
| Content Provider | Semantic Scholar |
|---|---|
| Author | Guo, Luke W. Lu, Wenjie Bennett, Brian R. Boos, John Brad Alamo, Jesús A. Del |
| Copyright Year | 2015 |
| Abstract | We demonstrate ultralow ohmic contact resistance to antimonide-based, p-channel quantum-well field-effect transistor (QW-FET) structures using a new p±-InAs/InAsSb cap structure. The incorporation of a p±-InAsSb layer enables the use of a thicker cap with lower sheet resistance, resulting in an improved contact resistivity. Using a Pd-based ohmic scheme, the composite cap structure resulted in a 4x reduction in contact resistance compared with a standard p±-InAs cap. This translates into nearly 3x improvement in the gm of fabricated InGaSb p-channel QW-FETs. Furthermore, Ni contacts on the composite cap were fabricated and a contact resistance of 45 Ω · μm was obtained. An accurate contact resistivity extraction in this very low range is possible through nanotransmission line models with sub-100 nm contacts. In devices of this kind with Ni-based contacts, we derive an ultralow contact resistivity of 5.2 · 10-8 Ω · cm2. |
| Starting Page | 546 |
| Ending Page | 548 |
| Page Count | 3 |
| File Format | PDF HTM / HTML |
| DOI | 10.1109/LED.2015.2421337 |
| Volume Number | 36 |
| Alternate Webpage(s) | http://www-mtl.mit.edu/~alamo/pdf/2015/RJ-158%20paper.pdf |
| Alternate Webpage(s) | http://dspace.mit.edu/bitstream/handle/1721.1/102323/Guo_Lu_EDL%202015.pdf;jsessionid=04B8D2333EF873A4EB4A08FE28405F15?sequence=1 |
| Alternate Webpage(s) | https://dspace.mit.edu/openaccess-disseminate/1721.1/102323 |
| Alternate Webpage(s) | https://dspace.mit.edu/bitstream/handle/1721.1/102323/Guo_Lu_EDL%202015.pdf;sequence=1 |
| Alternate Webpage(s) | https://doi.org/10.1109/LED.2015.2421337 |
| Journal | IEEE Electron Device Letters |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |