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Jitter Measuring System in High Speed Data Output Device and Totaljitter Measuring Method Background of the Invention
| Content Provider | Semantic Scholar |
|---|---|
| Copyright Year | 2017 |
| Abstract | In a System and method for measuring total litter in a high Speed data processing device, a high-speed data processing device, as an object under test, receives test data and generates differential output data at a high rate. A test device provides the test data to the high Speed data processing device and provides a comparison operation reference clock. A high-speed differential comparator is coupled between the high Speed data processing device and the test device for comparing the differential output data of the high Speed data processing device in response to the comparison operation reference clock. In this manner, measurement of total jitter in a high Speed data processing device can be achieved rapidly and without the need for employing a high-cost measuring instrument. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://patentimages.storage.googleapis.com/80/5d/05/3a9ee8c5e311bb/US20040019458A1.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Patent |
