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Device and Method for Measuring a Contour of an Object Field and Background of the Invention
| Content Provider | Semantic Scholar |
|---|---|
| Copyright Year | 2009 |
| Abstract | (51) International Patent Classification: CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, GOlB 3/56 (2006.01) EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, (21) International Application Number: KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, PCT/IL2009/000142 MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, (22) International Filing Date: NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, 8 February 2009 (08.02.2009) SK, SL, SM, ST, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. (25) Filing Language: English (84) Designated States (unless otherwise indicated, for every (26) Publication Language: English kind of regional protection available): ARIPO (BW, GH, |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://patentimages.storage.googleapis.com/89/6e/39/00e205aa7f9ab1/WO2009104173A2.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Patent |