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Thickness-dependent transport properties of Nd 2 Õ 3 Sr 1 Õ 3 MnO 3 thin films
| Content Provider | Semantic Scholar |
|---|---|
| Author | Barmana, A. Korenb, G. |
| Copyright Year | 2000 |
| Abstract | A systematic study is reported on the thickness dependence of the electrical resistivity in thin films of the giant magnetoresistance manganite Nd 2/3Sr1/3MnO3. We observed a first-order phase transition versus thickness in these films, which is seen as a jump of about 30 K in the metal-to-insulator transition temperature ( Tp) at film thickness of 50–60 nm. This phenomenon is attributed to a sudden release of strain in the film as its thickness increases. We also observed at low temperatures, 5–30 K, another transition from localized-to-metallic behavior versus film thickness, which is also related to the strain relief in the films. © 2000 American Institute of Physics. @S0003-6951 ~00!03137-5# |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://phweb.technion.ac.il/~gkoren/Thick_Dep.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
