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Characterization of Local Strain Structures in Heteroepitaxial Ge1−xSnx/Ge Microstructures by Using Microdiffraction Method
| Content Provider | Semantic Scholar |
|---|---|
| Author | Ike, Shinichi Moriyama, Yoshihiko Kurosawa, Masashi Taoka, Noriyuki Nakatsuka, Osamu Imai, Yasuhiko Kimura, Shigeru Tezuka, Tsutomu Zaima, Shigeaki |
| Copyright Year | 2013 |
| Abstract | Heteroepitaxial Ge1−xSnx/Ge Microstructures by using Microdiffraction Method S. Ike, Y. Moriyama, M. Kurosawa, N. Taoka, O. Nakatsuka, Y. Imai, S. Kimura, T. Tezuka, and S. Zaima Graduate School of Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan Green Nanoeletronics Center, AIST, West 7A, Onogawa 16-1, Tsukuba 305-8509, Japan Research Fellow of JSPS Japan Synchrotron Radiation Research Institute/SPring-8 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan |
| Starting Page | 185 |
| Ending Page | 192 |
| Page Count | 8 |
| File Format | PDF HTM / HTML |
| DOI | 10.1149/05809.0185ecst |
| Volume Number | 58 |
| Alternate Webpage(s) | https://ecs.confex.com/ecs/224/webprogram/Abstract/Paper26114/E12-2234.pdf |
| Alternate Webpage(s) | https://doi.org/10.1149/05809.0185ecst |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |