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Field Distribution Within Coaxial Scanning Near-Field Optical Microscope Tips
| Content Provider | Scilit |
|---|---|
| Author | Demming, F. von der Lieth, A. Klein, S. Dickmann, K. |
| Copyright Year | 2001 |
| Description | Journal: Advanced Functional Materials |
| Ending Page | 201 |
| Starting Page | 198 |
| ISSN | 2573508X |
| e-ISSN | 16163028 |
| DOI | 10.1002/1616-3028%28200106%2911%3A3%3C198%3A%3Aaid-adfm198%3E3.3.co%3B2-t |
| Journal | Advanced Functional Materials |
| Issue Number | 3 |
| Volume Number | 11 |
| Language | English |
| Publisher | Wiley-Blackwell |
| Publisher Date | 2001-06-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Advanced Functional Materials Finite Integration Technique (fit) Scanning Near-field Optical Microscopy (snom) |
| Content Type | Text |
| Resource Type | Article |
| Subject | Nanoscience and Nanotechnology Biomaterials Electronic, Optical and Magnetic Materials Condensed Matter Physics Electrochemistry |