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Investigation of the curing behavior of a novel epoxy photo‐dielectric dry film (ViaLux™ 81) for high density interconnect applications
| Content Provider | Scilit |
|---|---|
| Author | Dunne, Rajiv C. Sitaraman, Suresh K. Luo, Shijian Rao, Yang Wong, C. P. Estes, William E. Gonzalez, Ceferino G. Coburn, John C. Periyasamy, Mookan |
| Copyright Year | 2000 |
| Description | Journal: Journal of Applied Polymer Science |
| Ending Page | 437 |
| Starting Page | 430 |
| ISSN | 2573508X |
| e-ISSN | 10974628 |
| DOI | 10.1002/1097-4628%2820001010%2978%3A2%3C430%3A%3Aaid-app230%3E3.3.co%3B2-7 |
| Journal | Journal of Applied Polymer Science |
| Issue Number | 2 |
| Volume Number | 78 |
| Language | English |
| Publisher | Wiley-Blackwell |
| Publisher Date | 2000-10-10 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Applied Polymer Science High Density Interconnect-printed Wiring Boards (hdi-pwb) Photo-dielectric Dry Film (pddf) Differential Scanning Calorimetry (dsc) Cure Kinetics Isoconversional Method |
| Content Type | Text |
| Resource Type | Article |
| Subject | Chemistry Surfaces, Coatings and Films Materials Chemistry Polymers and Plastics |