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Symbiosis of microprocessor and film techniques in X-ray diffractometry
| Content Provider | Scilit |
|---|---|
| Author | Samuelsen, E. J. Moret, R. Hoier, R. |
| Copyright Year | 1987 |
| Description | Journal: Journal of Physics E: Scientific Instruments A two-axis X-ray diffractometer run by a microprocessor and equipped with a climbing detector to cover the upper hemisphere was provided with the option of exchanging the point detector with flat or cylindrical film cassettes. By synchronisation of the specimen rotation and the film motion, Weissenberg-type and other exposures are obtained. Various choices of the relative motions may be used to focus the attention on selected parts of the reciprocal space, which may be magnified and reshaped. The importance and convenience of being able to perform film and point detector studies on the same instrument and at any temperature are pointed out. |
| Related Links | http://iopscience.iop.org/article/10.1088/0022-3735/20/10/025/pdf |
| Ending Page | 1268 |
| Page Count | 5 |
| Starting Page | 1264 |
| ISSN | 00223735 |
| DOI | 10.1088/0022-3735/20/10/025 |
| Journal | Journal of Physics E: Scientific Instruments |
| Issue Number | 10 |
| Volume Number | 20 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 1987-10-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Physics E: Scientific Instruments Characterization and Testing of Materials X Ray Diffractometer |
| Content Type | Text |
| Resource Type | Article |
| Subject | Physics and Astronomy Instrumentation Engineering Materials Science |
