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Microprocessor control of high-temperature X-ray diffraction experiments
| Content Provider | Scilit |
|---|---|
| Author | Cosier, J. Glazer, A. M. Hastings, T. J. Smith, D. T. Wood, I. G. |
| Copyright Year | 1981 |
| Description | Journal: Journal of Physics E: Scientific Instruments A microprocessor control system for use with a high-temperature X-ray Weissenberg continuous-recording camera is described. The unit incorporates facilities for the control (at best +or-1/40 degrees C) and programming of temperature and for the operation of an X-ray beam shutter and film-increment motor. Complex experiments, which may involve temperature cycles, ramps, plateaux, etc., are concisely specified by combinations of six different programme modes and are carried out automatically, without operator intervention. The system is principally used in lattice-parameter and other related studies of single crystals undergoing solid-state phase transitions. |
| Related Links | http://iopscience.iop.org/article/10.1088/0022-3735/14/2/010/pdf |
| Ending Page | 174 |
| Page Count | 5 |
| Starting Page | 170 |
| ISSN | 00223735 |
| DOI | 10.1088/0022-3735/14/2/010 |
| Journal | Journal of Physics E: Scientific Instruments |
| Issue Number | 2 |
| Volume Number | 14 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 1981-02-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Physics E: Scientific Instruments Characterization and Testing of Materials Microprocessor Control High Temperature X Phase Transitions Temperature X Ray |
| Content Type | Text |
| Resource Type | Article |
| Subject | Physics and Astronomy Instrumentation Engineering Materials Science |