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The accuracies of methods for the optical constants of thin films using transmittances and phase changes on transmission
| Content Provider | Scilit |
|---|---|
| Author | Ward, L. |
| Copyright Year | 1985 |
| Description | Journal: Journal of Physics D: Applied Physics The study of the accuracy of methods for measuring the optical constants of thin films has been extended to combinations of transmittance and phase changes on transmission and also to transmission ellipsometry. All combinations of (T, phi$ _{T}$) and also the ellipsometric functions generally produced regions of accuracy on an n-k diagram in the form of a concentric quadrants whose size decreased with d/ lambda ; for $(T_{s}$, phi$ _{(Ts)}$) and $(T_{s}$, phi$ _{(Tp)}$) the size of the quadrant decreased with angle of incidence, but the reverse was the case for $(T_{p}$, phi$ _{(Tp)}$) and $(T_{p}$, phi$ _{(Ts)}$). The combination ( phi$ _{(Ts)}$, phi$ _{(Tp)}$) produced a double lobe pattern which showed only small regions of accuracy. |
| Related Links | http://iopscience.iop.org/article/10.1088/0022-3727/18/2/017/pdf |
| Ending Page | 298 |
| Page Count | 8 |
| Starting Page | 291 |
| ISSN | 00223727 |
| e-ISSN | 13616463 |
| DOI | 10.1088/0022-3727/18/2/017 |
| Journal | Journal of Physics D: Applied Physics |
| Issue Number | 2 |
| Volume Number | 18 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 1985-02-14 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Physics D: Applied Physics Optical Constants Constants of Thin Regions of Accuracy Transmittances and Phase |
| Content Type | Text |
| Resource Type | Article |
| Subject | Surfaces, Coatings and Films Acoustics and Ultrasonics Condensed Matter Physics Electronic, Optical and Magnetic Materials |
