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Improved classification EM algorithm for the problem of separating semiconductor device production batches
| Content Provider | Scilit |
|---|---|
| Author | Rozhnov, I. Kazakovtsev, L. Bezhitskaya, E. Bezhitskiy, S. |
| Copyright Year | 2019 |
| Description | Journal: Iop Conference Series: Materials Science and Engineering This paper focuses on new proposed algorithms for cluster problem solving. The proposed algorithms are based on Classification EM algorithm (CM-algorithm). The algorithms are new algorithms of the greedy heuristic method using the idea of searching in alternating neighborhoods. The numerical experiments show that the proposed algorithms have less mean values and/or less standard deviation of objective function, less scatter of obtained values in comparison with classical CEM-algorithm. |
| Related Links | https://iopscience.iop.org/article/10.1088/1757-899X/537/5/052032/pdf |
| ISSN | 17578981 |
| e-ISSN | 1757899X |
| DOI | 10.1088/1757-899x/537/5/052032 |
| Journal | Iop Conference Series: Materials Science and Engineering |
| Issue Number | 5 |
| Volume Number | 537 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 2019-06-18 |
| Access Restriction | Open |
| Subject Keyword | Journal: Iop Conference Series: Materials Science and Engineering Industrial Engineering Operations Research and Management Science |
| Content Type | Text |
| Resource Type | Article |
