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Estimation of the impact of semiconductor device parameters on the accuracy of separating a mixed production batch
| Content Provider | Scilit |
|---|---|
| Author | Shkaberina, G. Sh Orlov, V. I. Tovbis, E. M. Sugak, E. V. Kazakovtsev, L. A. |
| Copyright Year | 2019 |
| Description | Journal: Iop Conference Series: Materials Science and Engineering In this paper, we investigate the problem of separation of a mixed production batch of semiconductor devices for the space industry into homogeneous production batches. The method of factor analysis is applied to reduce the dimensionality of the problem. We investigate the impact of measured parameters of semiconductor devices in the accuracy of the separation of the mixed lot, composed several homogeneous batches. It was shown, that with any orthogonal rotations of factor structure as the number of homogeneous batches in the sample increases, the clustering accuracy reduces. Groups of semiconductor device parameters which have the greatest impact on the partition accuracy regardless of the number of homogeneous batches in the sample detected. |
| Related Links | https://iopscience.iop.org/article/10.1088/1757-899X/537/3/032088/pdf |
| ISSN | 17578981 |
| e-ISSN | 1757899X |
| DOI | 10.1088/1757-899x/537/3/032088 |
| Journal | Iop Conference Series: Materials Science and Engineering |
| Issue Number | 3 |
| Volume Number | 537 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 2019-05-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Iop Conference Series: Materials Science and Engineering Semiconductor Device Parameters Mixed Production Production Batch Separating a Mixed |
| Content Type | Text |
| Resource Type | Article |
