NDLI: Study of the Na - Si(111) 3 1 interface using core-level photoemission spectroscopy

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Study of the Na - Si(111) 3 1 interface using core-level photoemission spectroscopy

Content Provider	Scilit
Author	Zhang, X. S. Fan, C. Y. Xu, Y. B. Sui, H. Bao, S. Xu, S. H. Pan, H. B. Xu, P. S.
Copyright Year	1996
Description	Journal: Journal of Physics: Condensed Matter The Na - Si(111) and Na - Si(111) interfaces with various coverages of Na have been investigated using low-energy electron diffraction Auger electron spectroscopy and photoemission spectroscopy (PES) with a synchrotron radiation source. In decomposing the PES peak from the Si 2p core level into the surface and bulk components, the relative shifts and intensities of the surface components as well as the band bending for the interface are consistent with the structure model proposed by Mönch. The evolution of the band bending from about 1 monolayer to thick Na coverage corresponds to the theory of the metal-induced gap states. The final Schottky barrier height is determined to be eV and does not depend on whether a thicker Na layer is deposited on an ordered Na - Si(111) surface or a disordered thin Na layer on Si(111).
Related Links	http://iopscience.iop.org/article/10.1088/0953-8984/8/6/010/pdf
Ending Page	706
Page Count	8
Starting Page	699
ISSN	09538984
e-ISSN	1361648X
DOI	10.1088/0953-8984/8/6/010
Journal	Journal of Physics: Condensed Matter
Issue Number	6
Volume Number	8
Language	English
Publisher	IOP Publishing
Publisher Date	1996-02-05
Access Restriction	Open
Subject Keyword	Journal: Journal of Physics: Condensed Matter Applied Physics Condensed Matter Physics Auger Electron Spectroscopy Photoemission Spectroscopy Low Energy Electron Diffraction
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Materials Science

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