NDLI: Measuring grain boundary segregation: tomographic atom probe field ion microscopy (APFIM) vs. analytical scanning transmission electron microscopy (STEM)

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Measuring grain boundary segregation: tomographic atom probe field ion microscopy (APFIM) vs. analytical scanning transmission electron microscopy (STEM)

Content Provider	Scilit
Author	Walther, T.
Copyright Year	2019
Description	Journal: Journal of Physics: Conference Series Grain boundary segregation is an important phenomenon in metallurgy and semiconductor technology. Some recent studies by tomographic atom probe field ion microscopy (APFIM) claim to have measured the interfacial excess of atoms segregated to grain boundaries with ultra-high precision, down to 0.01-0.02 $atoms/nm^{2}$. This study critically evaluates these claims by simulations. It is shown that atom probe tomography is no ‘magic bullet’ and suffers similar physical constraints as analytical scanning transmission electron microscopy (STEM). Data analyses from both methods have much in common in terms of geometry, performance, systematic and statistical errors. It is shown that an analysis method previously developed for (S)TEM called conceptEM can also successfully be applied to APFIM data.
Related Links	https://iopscience.iop.org/article/10.1088/1742-6596/1190/1/012002/pdf
ISSN	17426588
e-ISSN	17426596
DOI	10.1088/1742-6596/1190/1/012002
Journal	Journal of Physics: Conference Series
Issue Number	1
Volume Number	1190
Language	English
Publisher	IOP Publishing
Publisher Date	2019-05-01
Access Restriction	Open
Subject Keyword	Journal: Journal of Physics: Conference Series Microscopic Research Grain Boundaries Atom Probe Grain Boundary Segregation
Content Type	Text
Resource Type	Article
Subject	Physics and Astronomy

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