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X-ray nanometer focusing at the SSRF based on a multilayer Laue lens
| Content Provider | Scilit |
|---|---|
| Author | Zhu, Jing-Tao Tu, Yu-Chun Li, Hao-Chuan Yue, Shuai-Peng Huang, Qiu-Shi Li, Ai-Guo Wang, Zhan-Shan |
| Copyright Year | 2015 |
| Description | Journal: Chinese Physics C We designed and fabricated a multilayer Laue lens (MLL) as a hard X-ray focusing device. $WSi_{2}$/Si multilayers were chosen owing to their excellent optical properties and relatively sharp interface. The multilayer sample was fabricated by using direct current (DC) magnetron sputtering technology and then was sliced and thinned to form an MLL. The thickness of each layer was determined by scanning electron microscopy (SEM) image analysis with marking layers. The focusing property of the MLL was measured at Beamline 15U, Shanghai Synchrotron Facility (SSRF). One-dimensional (1D) focusing resolutions of 92 nm are obtained at photon energy of 14 keV. |
| Related Links | http://iopscience.iop.org/article/10.1088/1674-1137/39/12/128001/pdf |
| ISSN | 16741137 |
| e-ISSN | 20586132 |
| DOI | 10.1088/1674-1137/39/12/128001 |
| Journal | Chinese Physics C |
| Issue Number | 12 |
| Volume Number | 39 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 2015-12-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Chinese Physics C Characterization and Testing of Materials Multilayer Laue Laue Lens |
| Content Type | Text |
| Resource Type | Article |
| Subject | Nuclear and High Energy Physics Instrumentation Astronomy and Astrophysics |
