Loading...
Please wait, while we are loading the content...
Similar Documents
Hard X-ray one dimensional nano-focusing at the SSRF using a WSi 2 /Si multilayer Laue lens
| Content Provider | Scilit |
|---|---|
| Author | Huang, Qiu-Shi Li, Hao-Chuan Song, Zhu-Qing Zhu-Qing, Song Wang, Zhan-Shan Li, Ai-Guo Yan, Shuai Mao, Cheng-Wen Wang, Hua Yan, Fen Zhang, Ling Yu, Xiao-Han Liu, Peng Li, Ming |
| Copyright Year | 2013 |
| Description | Journal: Chinese Physics C The multilayer Laue lens (MLL) is a novel diffraction optics which can realize nanometer focusing of hard X-rays with high efficiency. In this paper, a 7.9 μm-thick MLL with the outmost layer thickness of 15 nm is designed based on dynamical diffraction theory. The MLL is fabricated by first depositing the depth-graded multilayer using direct current (DC) magnetron sputtering technology. Then, the multilayer sample is sliced, and both cross-sections are thinned and polished to a depth of 35–41 μm. The focusing property of the MLL is measured at the Shanghai Synchrotron Facility (SSRF). One-dimensional (1D) focusing resolutions of 205 nm and 221 nm are obtained at E=14 keV and 18 keV, respectively. It demonstrates that the fabricated MLL can focus hard X-rays into nanometer scale. |
| Related Links | http://iopscience.iop.org/article/10.1088/1674-1137/37/2/028002/pdf |
| ISSN | 16741137 |
| e-ISSN | 20586132 |
| DOI | 10.1088/1674-1137/37/2/028002 |
| Journal | Chinese Physics C |
| Issue Number | 2 |
| Volume Number | 37 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 2013-02-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Chinese Physics C Characterization and Testing of Materials Hard X Dimensional Nano Laue Lens |
| Content Type | Text |
| Resource Type | Article |
| Subject | Nuclear and High Energy Physics Instrumentation Astronomy and Astrophysics |
