Loading...
Please wait, while we are loading the content...
Similar Documents
$Si_{1-x}Ge_{x}$ Laterally Graded Crystals as Monochromators for X-Ray Absorption Spectroscopy Studies
| Content Provider | Scilit |
|---|---|
| Author | Veldkamp, Markus Erko, Alexei Gudat, Wolfgang Abrosimov, Nikolai V. Alex, Volker Khasanov, Salavat Shekhtman, Veniamin Neissendorfer, Frank Pietsch, Ullrich |
| Copyright Year | 1999 |
| Description | Journal: Japanese Journal of Applied Physics Using the BESSY I wavelength shifter (WLS) beamline we have examined the energy resolution of a laterally graded $Si_{1-x}Ge_{x}$ crystal in the full divergent, white synchrotron beam. At the Fe-K absorption edge (E = 7112 eV) we have measured an energy resolution of $E/ΔE=7.1·10^{4}$ for the (440) reflection and a vertical divergence of 0.63 mrad. For a pure Si(440) reference crystal and the same divergence we found $E/ΔE=7.1·10^{3}$ which means a factor of 10 improvement in the case of the laterally graded crystal. Similar results have been obtained at the Co-K absorption edge (E = 7710 eV) with an increase of 2.6 for E/ΔE. We present the experimental set-up and a method for the characterization of the absolute lattice parameter with a precision of $Δd/d=2·10^{-5}$. In addition, we discuss the application of the laterally graded $Si_{1-x}Ge_{x}$ crystals in the crystal monochromator KMC-2 at the BESSY II storage ring. |
| Related Links | http://iopscience.iop.org/article/10.7567/JJAPS.38S1.612/pdf |
| ISSN | 00214922 |
| e-ISSN | 13474065 |
| DOI | 10.7567/jjaps.38s1.612 |
| Journal | Japanese Journal of Applied Physics |
| Issue Number | S1 |
| Volume Number | 38 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 1999-01-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Japanese Journal of Applied Physics Laterally Graded Si |
| Content Type | Text |
| Resource Type | Article |
| Subject | Physics and Astronomy Engineering |
