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The optimisation of the phase thickness in the determination of the optical constants of thin dielectric and slightly absorbing films
| Content Provider | Scilit |
|---|---|
| Author | Shaalan, M. S. Muawad, S. |
| Copyright Year | 1983 |
| Description | Journal: Journal of Physics D: Applied Physics The change of phase upon reflection at an air/film interface, beta , for dielectric and slightly absorbing films is shown to be an experimental parameter sensitive to both film thickness and optical constants. High sensitivities are found at film thicknesses where $(n_{1}$d/ lambda ) approximately=0.5. For selenium a change of 1 degrees in beta would result from Delta $n_{1}$=0.004 and Delta d approximately=1.5 AA. For Se films the real part of $n_{1}-n_{1}-ik_{1}$ is obtained experimentally with an uncertainty of 1.4%. |
| Related Links | http://iopscience.iop.org/article/10.1088/0022-3727/16/3/025/pdf |
| Ending Page | 423 |
| Page Count | 5 |
| Starting Page | 419 |
| ISSN | 00223727 |
| e-ISSN | 13616463 |
| DOI | 10.1088/0022-3727/16/3/025 |
| Journal | Journal of Physics D: Applied Physics |
| Issue Number | 3 |
| Volume Number | 16 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 1983-03-14 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Physics D: Applied Physics Slightly Absorbing Optical Constants Phase Upon Reflection |
| Content Type | Text |
| Resource Type | Article |
| Subject | Surfaces, Coatings and Films Acoustics and Ultrasonics Condensed Matter Physics Electronic, Optical and Magnetic Materials |
