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Advances in indirect detector systems for ultra high-speed hard X-ray imaging with synchrotron light
| Content Provider | Scilit |
|---|---|
| Author | Olbinado, M. P. Grenzer, J. Pradel, P. Resseguier, T. De Vagovic, P. Zdora, M. -C. Guzenko, V. A. David, C. Rack, A. |
| Copyright Year | 2018 |
| Description | Journal: Journal of Instrumentation We report on indirect X-ray detector systems for various full-field, ultra high-speed X-ray imaging methodologies, such as X-ray phase-contrast radiography, diffraction topography, grating interferometry and speckle-based imaging performed at the hard X-ray imaging beamline ID19 of the European Synchrotron—ESRF. Our work highlights the versatility of indirect X-ray detectors to multiple goals such as single synchrotron pulse isolation, multiple-frame recording up to millions frames per second, high efficiency, and high spatial resolution. Besides the technical advancements, potential applications are briefly introduced and discussed. |
| Related Links | https://iopscience.iop.org/article/10.1088/1748-0221/13/04/C04004/pdf |
| Ending Page | C04004 |
| Page Count | 1 |
| Starting Page | C04004 |
| ISSN | 17480221 |
| e-ISSN | 17480221 |
| DOI | 10.1088/1748-0221/13/04/c04004 |
| Journal | Journal of Instrumentation |
| Issue Number | 04 |
| Volume Number | 13 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 2018-04-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Instrumentation Characterization and Testing of Materials X Ray Imaging High Speed |
| Content Type | Text |
| Resource Type | Article |
| Subject | Instrumentation Mathematical Physics |
