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Improvement in sensitivity of an indirect-type organic X-ray detector using an amorphous IGZO interfacial layer
| Content Provider | Scilit |
|---|---|
| Author | Liu, H. Hussain, S. Kang, J. |
| Copyright Year | 2020 |
| Description | Journal: Journal of Instrumentation To improve the power conversion efficiency (PCE) and sensitivity of indirect-type organic X-ray detectors, we examined the role of amorphous indium-gallium-zinc-oxide (a-IGZO) as an interfacial layer placed between the PBDB-T: PCBM active layer and the LiF/Al cathode. By RF magnetron sputtering, a-IGZO films with different thicknesses were deposited on a PBDB-T: PCBM active layer at room temperature. The optimized detector with a 10.1 nm a-IGZO layer achieved the highest PCE of 7.45% under artificial solar illumination, which was higher than the PCE (5.43%) of the detector without an a-IGZO layer. Furthermore, the highest sensitivity of 2.82 $mA/Gy⋅cm^{2}$ under X-ray exposure was achieved for the detector with the 10.1 nm a-IGZO layer, which was an improvement of 26% over the X-ray detector without an a-IGZO layer. |
| Related Links | https://iopscience.iop.org/article/10.1088/1748-0221/15/02/P02002/pdf |
| Ending Page | P02002 |
| Page Count | 1 |
| Starting Page | P02002 |
| ISSN | 17480221 |
| e-ISSN | 17480221 |
| DOI | 10.1088/1748-0221/15/02/p02002 |
| Journal | Journal of Instrumentation |
| Issue Number | 02 |
| Volume Number | 15 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 2020-02-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Instrumentation Characterization and Testing of Materials X Ray Detector |
| Content Type | Text |
| Resource Type | Article |
| Subject | Instrumentation Mathematical Physics |
