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Microwave dielectric measurements using time domain spectroscopy: note on recent technique advances
| Content Provider | Scilit |
|---|---|
| Author | Suggett, A. |
| Copyright Year | 1975 |
| Description | Journal: Journal of Physics E: Scientific Instruments Use of the techniques of time domain spectroscopy (TDS) to determine the microwave properties of materials is a rapidly developing field. Two recent advances in techniques are described. Firstly, a method for reducing the uncertainty with which the time domain waveform can be referred to a common time origin which permits 'time referencing' to better than 0.08 ps-more than an order of magnitude improvement on the use of more conventional 'time markers'-and requires only the basic TDS instrumentation, and secondly, a variation in TDS technique involving the use of a high pass filter. By eliminating the effects of 'low frequency noise', a better defined pulse shape for Fourier transformation is produced, thus reducing truncation errors. |
| Related Links | http://iopscience.iop.org/article/10.1088/0022-3735/8/4/027/pdf |
| Ending Page | 330 |
| Page Count | 4 |
| Starting Page | 327 |
| ISSN | 00223735 |
| DOI | 10.1088/0022-3735/8/4/027 |
| Journal | Journal of Physics E: Scientific Instruments |
| Issue Number | 4 |
| Volume Number | 8 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 1975-04-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Physics E: Scientific Instruments Condensed Matter Physics Time Domain Truncation Error Dielectric Properties Fourier Transform High Pass Filter Pulse Shaping |
| Content Type | Text |
| Subject | Physics and Astronomy Instrumentation Engineering Materials Science |
