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scale and, therefore, under-
| Content Provider | Scilit |
|---|---|
| Author | Drelich, J. Mittal, Kash L. |
| Copyright Year | 2005 |
| Description | To use the AFM as a quantitative tool to investigate interfacial adhesion, cantilever calibration procedures and contact mechanics modeling need to be applied consistently. Adhesion data taken with the AFM can vary significantly due to seemingly subtle changes in the environmental conditions, AFM tip material and/or geometry, and surface contamination and/or modification. To ensure that calculated values for work of adhesion are intrinsic to the interface tested, rigorous characterization techniques of the tip and surface materials should be performed. Book Name: Atomic Force Microscopy in Adhesion Studies |
| Related Links | https://content.taylorfrancis.com/books/download?dac=C2012-0-01935-9&isbn=9780429087295&doi=10.1201/b12164-28&format=pdf |
| Ending Page | 96 |
| Page Count | 5 |
| Starting Page | 92 |
| DOI | 10.1201/b12164-28 |
| Language | English |
| Publisher | Informa UK Limited |
| Publisher Date | 2005-10-01 |
| Access Restriction | Open |
| Subject Keyword | Book Name: Atomic Force Microscopy in Adhesion Studies Surface Contamination |
| Content Type | Text |
| Resource Type | Chapter |