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Atomic Force Microscopy in Adhesion Studies
| Content Provider | Scilit |
|---|---|
| Copyright Year | 2005 |
| Description | Since its discovery, Atomic Force Microscopy (AFM) has become a technique of choice for non-destructive surface characterization with sub-molecular resolution. The AFM has also emerged as a problem-solving tool in applications relevant to particle-solid and particle-liquid interactions, design, fabrication, and characterization of new materials, an Book Name: Atomic Force Microscopy in Adhesion Studies |
| Related Links | https://api.taylorfrancis.com/content/books/mono/download?identifierName=doi&identifierValue=10.1201/b12164&type=googlepdf |
| DOI | 10.1201/b12164 |
| Language | English |
| Publisher | Informa UK Limited |
| Publisher Date | 2005-10-01 |
| Access Restriction | Open |
| Subject Keyword | Book Name: Atomic Force Microscopy in Adhesion Studies Force Microscopy Atomic Force Particle Solid New Materials Liquid Interactions Problem Solving Particle Liquid Destructive Surface Molecular Resolution |
| Content Type | Text |
| Resource Type | Chapter |