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effect of increasing the maximum
| Content Provider | Scilit |
|---|---|
| Author | Drelich, J. Mittal, Kash L. |
| Copyright Year | 2005 |
| Description | The TappingModeâ„¢ etched silicon probes (TESP) cantilevers were purchased from Digital Instruments. Intermittent contact mode (TappingModeâ„¢) was used to image the gold surfaces of the coated silicon substrates using a Dimension 3000 AFM (Digital Instruments). Scan sizes of 500 nm x 500 nm, 1 /zm x 1 /zm and 2.5 /zm x 2.5 /zm were taken at a scan rate in the range of 0.75-1 Hz. The ratio of the setpoints, r s p , was set to no lower than 0.8 to minimize sample damage caused by the AFM tip. Book Name: Atomic Force Microscopy in Adhesion Studies |
| Related Links | https://content.taylorfrancis.com/books/download?dac=C2012-0-01935-9&isbn=9780429087295&doi=10.1201/b12164-77&format=pdf |
| Ending Page | 260 |
| Page Count | 8 |
| Starting Page | 253 |
| DOI | 10.1201/b12164-77 |
| Language | English |
| Publisher | Informa UK Limited |
| Publisher Date | 2005-10-01 |
| Access Restriction | Open |
| Subject Keyword | Book Name: Atomic Force Microscopy in Adhesion Studies Instrumentation Intermittent |
| Content Type | Text |
| Resource Type | Chapter |