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Trimming phase and birefringence errors in planar lightwave circuits with deep ultraviolet femtosecond laser
| Content Provider | Scilit |
|---|---|
| Author | Chen, Q. Chen, K.P. Buric, M. Nikumb, S. |
| Copyright Year | 2004 |
| Related Links | https://nrc-publications.canada.ca/eng/view/accepted/?id=ea453f9f-d732-4029-afc6-ba1f369f1e0c |
| Ending Page | 1181 |
| Page Count | 3 |
| Starting Page | 1179 |
| DOI | 10.1049/el:20045975 |
| Journal | Electronics Letters |
| Issue Number | 19 |
| Volume Number | 40 |
| Language | English |
| Publisher | Institution of Engineering and Technology (IET) |
| Publisher Date | 2004-01-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Electronics Letters Krf Excimer Laser Deep Ultraviolet Femtosecond Laser Silica Waveguies Birefringence Errors Refractive Index Trimming Phase Errors Ultraviolet Photosensitivity Hydrogen Free Mach-zehnder Planar Waveguide Circuit Planar Lightwave Circuits |
| Content Type | Text |
| Resource Type | Article |