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Adhesive-Based Atom Probe Sample Preparation
| Content Provider | Scilit |
|---|---|
| Author | Rout, Surya S. Heck, Philipp R. Zaluzec, Nestor J. Isheim, Dieter Miller, Dean J. Seidman, David N. |
| Copyright Year | 2018 |
| Description | We present a specimen preparation procedure for atom-probe tomography using SemGlu from Kleindiek Nanotechnik, an adhesive that hardens under electron beam irradiation. The SemGlu adhesive is used in place of focused-ion-beam-induced deposition of organo-metallic Pt, W, or C to form a bond between the sample and the substrate during the specimen preparation procedure. We demonstrate the utility of this adhesive-based specimen preparation technique with a correlated atom-probe tomography-scanning transmission electron microscopy study of the iron-nickel alloy kamacite (ferrite, ɑ-iron) in the Bristol iron meteorite and two steel specimens. |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/8194D9B513E4408132304FDAC1AC641D/S1551929518000238a.pdf/div-class-title-adhesive-based-atom-probe-sample-preparation-div.pdf |
| Ending Page | 31 |
| Page Count | 8 |
| Starting Page | 24 |
| ISSN | 15519295 |
| e-ISSN | 21503583 |
| DOI | 10.1017/s1551929518000238 |
| Journal | Microscopy Today |
| Issue Number | 2 |
| Volume Number | 26 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2018-03-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy Today Microscopic Research probe Tomography (apt) Specimen Preparation Scanning Transmission Electron Microscopy ((s)tem) Bristol Iron Meteorite |
| Content Type | Text |
| Resource Type | Article |