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Ionic Liquid Used for Charge Compensation for High-Resolution Imaging and Analysis in the FE-SEM
| Content Provider | Scilit |
|---|---|
| Author | Brodusch, Nicolas Demers, Hendrix Gauvin, Raynald |
| Copyright Year | 2014 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/C676D1173104736B6D1E560E71DDA743/S1431927614001913a.pdf/div-class-title-ionic-liquid-used-for-charge-compensation-for-high-resolution-imaging-and-analysis-in-the-fe-sem-div.pdf |
| Ending Page | 39 |
| Page Count | 2 |
| Starting Page | 38 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927614001913 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S3 |
| Volume Number | 20 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2014-08-27 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Atmospheric Sciences |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |