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X-ray Spectrum Imaging at High Resolution in the STEM and STEM/SEM and SEM
| Content Provider | Scilit |
|---|---|
| Author | Sagar, James Wood, Dylan Pinard, Philippe Howe, Jane Holland, James Burgess, Simon Statham, Peter |
| Copyright Year | 2018 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/8545F8ECB5C2EEB10242AB3D56DE4716/S143192761800377Xa.pdf/div-class-title-x-ray-spectrum-imaging-at-high-resolution-in-the-stem-and-stem-sem-and-sem-div.pdf |
| Ending Page | 657 |
| Page Count | 2 |
| Starting Page | 656 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s143192761800377x |
| Journal | Microscopy and Microanalysis |
| Issue Number | S1 |
| Volume Number | 24 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2018-08-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Atmospheric Sciences |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |