NDLI: Auger electron, electron energy loss, secondary electron emission and secondary ion mass spectroscopic studies on the oxidation of hafnium at room temperature

Please wait, while we are loading the content...

Stochastic modelling of the influence of an applied electric field on the ion recombination kinetics of multiple-ion-pair spurs in low-permittivity liquids

Enthalpies of formation of buckminsterfullerene (C₆₀) and of the parent ions C₆₀⁺, C₆₀²⁺, C₆₀³⁺ and C₆₀^–

Gas viscosities and intermolecular interactions of replacement refrigerants HCFC 123 (2,2-dichloro-1,1,1-trifluoroethane), HCFC 124 (2-chloro-1,1,1,2-tetrafluoroethane) and HFC 134a (1,1,1,2-tetrafluoroethane)

Temperature coefficients of Cu|Cu²⁺ and Hg|Hg²⁺ electrode potentials and Gibbs energies, entropies and enthalpies of transfer for Cu²⁺ and Hg²⁺

Gibbs energies, entropies and enthalpies of transfer for monovalent cations from acetonitrile to several solvents

Kinetics of the solvolysis of a cationic and of an anionic chlorocobalt(III) complex in water–glucose mixtures: anomalous effects on the enthalpy and entropy of activation

Alkali-metal ion catalysis of the oxidation of L-ascorbic acid by hexacyanoferrate(III) in strongly acidic media

Kinetic asymmetry between crystal growth and dissolution: step movement at low temperatures

Microstructure of the CTAB–butanol–octane–water microemulsion system: effect of dissolved salts

Dynamics of room-temperature melts: nuclear magnetic resonance measurements of dialkylimidazolium haloaluminates

Crystal structure determination of C₃Cl+3AlCl–4 and ab initio studies of the structure and vibrational spectrum of the trichlorocyclopropenium cation

Variable-temperature infrared spectroscopic study of some molybdenum bronzes: evidence for electron–phonon coupling

Auger electron, electron energy loss, secondary electron emission and secondary ion mass spectroscopic studies on the oxidation of hafnium at room temperature

Computer simulation of the adsorption of a fluid mixture in zeolite Y

Surface models for γ-Al₂O₃ from molecular dynamics simulations

Modelling of the kinetics of a gas–solid reaction involving a surface transient

Vapour-phase oxidation of diamond surfaces in O₂ studied by diffuse reflectance Fourier-transform infrared and temperture-programmed desorption spectroscopy

Dehydrogeno-aromatization of cyclohexanes with suspended noble-metal catalysts

Unsupported molybdena catalysts: precipitation, characterization and catalytic activity

Influence of preparation method on the characteristics of nickel/sepiolite catalysts

Characterization by infrared and nuclear magnetic resonance spectroscopies of calcined beta zeolite

Corrigendum

Back cover

Back matter

Journal of the Chemical Society, Faraday Transactions Vol - 89 Issue - 9

Journal of the Chemical Society, Faraday Transactions Vol - 89 Issue - 8

Journal of the Chemical Society, Faraday Transactions Vol - 89 Issue - 7

Journal of the Chemical Society, Faraday Transactions Vol - 89 Issue - 6

Journal of the Chemical Society, Faraday Transactions Vol - 89 Issue - 5

Journal of the Chemical Society, Faraday Transactions Vol - 89 Issue - 4

Journal of the Chemical Society, Faraday Transactions Vol - 89 Issue - 3

Auger electron, electron energy loss, secondary electron emission and secondary ion mass spectroscopic studies on the oxidation of hafnium at room temperature

Content Provider	Royal Society of Chemistry (RSC)
Author	Kurahashi, Mitsunori Kaneda, Akira Mabuchi, Mahito Satake, Tetsuya Natio, Shizuo Hashino, Tomoyasu Yamamoto, Masahiro
Copyright Year	1993
Abstract	Auger electron spectroscopy (AES), electron energy loss spectroscopy (EELS), secondary electron emission spectroscopy (SES) and secondary ion mass spectrometry (SIMS) have been used to investigate the oxidation of a hafniun surface at room temperature (298 K). The change in the electronic energies of the core and valence levels with the oxidation is discussed on the basis of the comparison between the observed spectra and the electronic structures calculated for a hafnium atom, ion, bulk metal and bulk oxide. The growth of oxide films to a thickness of ca. 1.5 nm is found from the decay in the intensity of Auger electrons emitted by the metal substrate and from the depth profile of the SIMS spectra.
Starting Page	3611
Ending Page	3618
Page Count	8
File Format	PDF
ISSN	09565000
Volume Number	89
Issue Number	19
Journal	Journal of the Chemical Society, Faraday Transactions
DOI	10.1039/FT9938903611
Language	English
Publisher	Royal Society of Chemistry
Access Restriction	Open
Subject Keyword	Spectroscopy Hafnium Electron spectroscopy Ion SIMS Auger electron spectroscopy SES S.A. Mass spectrometry Electron energy loss spectroscopy
Content Type	Text
Resource Type	Article
Subject	Physical and Theoretical Chemistry

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Auger Electron Spectroscopy and Secondary Ion Mass Spectrometry

Static secondary ion mass spectrometry studies of self-assembled monolayers: electron beam degradation of alkanethiols on gold

Characterization of Surface Segregation and Selective Oxidation of Manganese in Fe–30Mn–9Al Alloy with Auger Electron and Secondary Ion Mass Spectrometry

Surface characterization of ceramic materials. [LEED, AES, XPS, ion scattering spectroscopy, secondary ion mass spectroscopy]

Low-energy electron diffraction and auger electron spectroscopy study of the oxidation of Ti {0001} at room temperature

Electron Flood Charge Compensation Device for Ion Trap Secondary Ion Mass Spectrometry

Comparison of submicron particle analysis by Auger electron spectroscopy, time‐of‐flight secondary ion mass spectrometry, and secondary electron microscopy with energy dispersive x‐ray spectroscopy

Secondary ion mass spectrometry (sims):.

The properties of surface oxidation of zirconium by auger electron spectroscopy and secondary ion mass spectroscopy

Auger electron, electron energy loss, secondary electron emission and secondary ion mass spectroscopic studies on the oxidation of hafnium at room temperature

Similar Documents

Auger Electron Spectroscopy and Secondary Ion Mass Spectrometry

Static secondary ion mass spectrometry studies of self-assembled monolayers: electron beam degradation of alkanethiols on gold

Characterization of Surface Segregation and Selective Oxidation of Manganese in Fe–30Mn–9Al Alloy with Auger Electron and Secondary Ion Mass Spectrometry

Surface characterization of ceramic materials. [LEED, AES, XPS, ion scattering spectroscopy, secondary ion mass spectroscopy]

Low-energy electron diffraction and auger electron spectroscopy study of the oxidation of Ti {0001} at room temperature

Electron Flood Charge Compensation Device for Ion Trap Secondary Ion Mass Spectrometry

Comparison of submicron particle analysis by Auger electron spectroscopy, time‐of‐flight secondary ion mass spectrometry, and secondary electron microscopy with energy dispersive x‐ray spectroscopy

Secondary ion mass spectrometry (sims):.

The properties of surface oxidation of zirconium by auger electron spectroscopy and secondary ion mass spectroscopy

Auger electron, electron energy loss, secondary electron emission and secondary ion mass spectroscopic studies on the oxidation of hafnium at room temperature