NDLI: Surface characterization of ceramic materials. [LEED, AES, XPS, ion scattering spectroscopy, secondary ion mass spectroscopy]

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Surface characterization of ceramic materials. [LEED, AES, XPS, ion scattering spectroscopy, secondary ion mass spectroscopy]

Content Provider	United States Department of Energy Office of Scientific and Technical Information (OSTI.GOV)
Author	Somorjai, G. A. Salmeron, M.
Organization	California Univ., Berkeley (USA). Lawrence Berkeley Lab.
Abstract	In recent years several techniques have become available to characterize the structure and chemical composition of surfaces of ceramic materials. These techniques utilize electron scattering and scattering of ions from surfaces. Low-energy electron diffraction is used to determine the surface structure, Auger electron spectroscopy and other techniques of electron spectroscopy (ultraviolet and photoelectron spectroscopies) are employed to determine the composition of the surface. In addition the oxidation state of surface atoms may be determined using these techniques. Ion scattering mass spectrometry and secondary ion mass spectrometry are also useful in characterizing surfaces and their reactions. These techniques, their applications and the results of recent studies are discussed. 12 figures, 52 references, 2 tables.
Related Links	https://www.osti.gov/biblio/7237311
Page Count	34
File Format	PDF
Language	English
Publisher Date	1976-09-24
Publisher Place	United States
Access Restriction	Open
Subject Keyword	MATERIALS SCIENCE PHYSICAL AND ANALYTICAL CHEMISTRY INORGANIC ORGANIC CERAMICS STRUCTURAL CHEMICAL ANALYSIS RADIOMETRIC ANALYSIS REVIEWS SURFACES AUGER ELECTRON SPECTROSCOPY ELECTRON DIFFRACTION ION EMISSION ION SCATTERING ANALYSIS MASS SPECTROSCOPY OXIDATION PHOTOELECTRON SPECTROSCOPY SECONDARY EMISSION SURFACE PROPERTIES CHEMICAL ANALYSIS CHEMICAL REACTIONS COHERENT SCATTERING DIFFRACTION DOCUMENT TYPES ELECTRON SPECTROSCOPY EMISSION NONDESTRUCTIVE ANALYSIS QUANTITATIVE CHEMICAL ANALYSIS SCATTERING SPECTROSCOPY Refractories Structure & Phase Studies Ceramics Cermets Radiometric & Radiochemical Procedures (-1987)
Content Type	Text
Resource Type	Article

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