NDLI: A nanometre-scale resolution interference-based probe of interfacial phenomena between microscopic objects and surfaces

Content Provider	PubMed Central
Author	Contreras-naranjo, Jose C. Ugaz, Victor M.
Copyright Year	2013
Abstract	Interferometric techniques have proven useful to infer proximity and local surface profiles of microscopic objects near surfaces. But a critical trade-off emerges between accuracy and mathematical complexity when these methods are applied outside the vicinity of closest approach. Here we introduce a significant advancement that enables reflection interference contrast microscopy to provide nearly instantaneous reconstruction of an arbitrary convex object’s contour next to a bounding surface with nanometre resolution, making it possible to interrogate microparticle/surface interaction phenomena at radii of curvature 1,000 times smaller than those accessible by the conventional surface force apparatus. The unique view-from-below perspective of reflection interference contrast microscopy also reveals previously unseen deformations and allows the first direct observation of femtolitre-scale capillary condensation dynamics underneath micron-sized particles. Our implementation of reflection interference contrast microscopy provides a generally applicable nanometre-scale resolution tool that can be potentially exploited to dynamically probe ensembles of objects near surfaces so that statistical/probabilistic behaviour can be realistically captured.
Related Links	http://dx.doi.org/10.1038/ncomms2865
Starting Page	1919
File Format	PDF
ISSN	20411723
e-ISSN	20411723
Journal	Nature Communications
Volume Number	4
Language	English
Publisher	Nature Pub. Group
Publisher Date	2013-05-28
Access Restriction	Open
Rights Holder	Nature Pub. Group
Subject Keyword	Research in Higher Education
Content Type	Text
Resource Type	Article
Subject	Chemistry Physics and Astronomy Biochemistry, Genetics and Molecular Biology

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

A nanometre-scale resolution interference-based probe of interfacial phenomena between microscopic objects and surfaces

Raman spectroscopy as probe of nanometre-scale strain variations in graphene

Frustration-induced nanometre-scale inhomogeneity in a triangular antiferromagnet

Three-dimensional nanometre localization of nanoparticles to enhance super-resolution microscopy

Magnetization amplified by structural disorder within nanometre-scale interface region

Erratum: Nanometre-scale probing of spin waves using single electron spins

Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging

Sub-nanometre resolution imaging of polymer–fullerene photovoltaic blends using energy-filtered scanning electron microscopy

Carrier separation and transport in perovskite solar cells studied by nanometre-scale profiling of electrical potential

A nanometre-scale resolution interference-based probe of interfacial phenomena between microscopic objects and surfaces

Similar Documents

A nanometre-scale resolution interference-based probe of interfacial phenomena between microscopic objects and surfaces

Raman spectroscopy as probe of nanometre-scale strain variations in graphene

Frustration-induced nanometre-scale inhomogeneity in a triangular antiferromagnet

Three-dimensional nanometre localization of nanoparticles to enhance super-resolution microscopy

Magnetization amplified by structural disorder within nanometre-scale interface region

Erratum: Nanometre-scale probing of spin waves using single electron spins

Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging

Sub-nanometre resolution imaging of polymer–fullerene photovoltaic blends using energy-filtered scanning electron microscopy

Carrier separation and transport in perovskite solar cells studied by nanometre-scale profiling of electrical potential

A nanometre-scale resolution interference-based probe of interfacial phenomena between microscopic objects and surfaces