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Content Provider | IET Digital Library |
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Author | Lin, Han Nien Chen, Hung Chi Kuo, Chung Wei Chang, Yen Tang |
Abstract | This study is based on International Electrotechnical Commission (IEC) 61967-4 standards for measuring electromagnetic emissions and interferences at the chip level. Conventional measurement methods using fixed SMA connectors were replaced with an improved radio frequency current probe featuring semi-rigid coaxial cables, making it capable of taking mobile measurements, enhancing the flexibility and convenient probing usage. To effectively assess the practical value of the improved probe, the authors have referred to the standard designs provided in IEC 61967-1 to manufacture a four-layer digital circuit board that controls the screen of an on-board navigational screen for automobiles. Circuit board electromagnetic interference (EMI) noise frequency and level readings from the improved probe were also compared with three other measurement methods, namely magnetic field probes available in the market, TEM cells, and the 10-m far-field measurement method. The results demonstrated the capability of the improved probe to effectively identify sources of noise at the chip-level during the IC design phases, helping with root cause analysis and allowing EMI noises experienced by the product to be solved promptly during the process of electromagnetic compatibility design optimisation and analysis. |
Starting Page | 655 |
Ending Page | 665 |
Page Count | 11 |
ISSN | 17518822 |
Volume Number | 11 |
e-ISSN | 17518830 |
Issue Number | Issue 5, Aug (2017) |
Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/iet-smt/11/5 |
Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/10.1049/iet-smt.2016.0348 |
Journal | IET Science, Measurement & Technology |
Publisher Date | 2017-03-29 |
Access Restriction | Open |
Rights Holder | © The Institution of Engineering and Technology |
Subject Keyword | Circuit Board Electromagnetic Interference Noise Coaxial Cables Current Measurement Distance 10 M Electric Current Measurement Electric Field Measurement Electric Sensing Device Electromagnetic Compatibility Electromagnetic Compatibility Design Optimisation Electromagnetic Emission Measurement EMI Noise Fixed SMA Connector Four-layer Digital Circuit Board IC Circuit Design Phase IEC 61967-1 IEC 61967-4 Standard Integrated Circuit Design Interference Interference Measurement International Electrotechnical Commission 61967-4 Standard Layout Magnetic Field Measurement Magnetic Field Probe Magnetic Sonsor Magnetic Variables Measurement Measurement of Basic Electric And Magnetic Variables Mobile Measurement Mobile Miniature Radiofrequency Current Probe Modelling And Testing On-board Navigational Automobile Screen Probes Radio Frequency Interference Root Cause Analysis Semiconductor Integrated Circuit Design Semirigid Coaxial Cable Sensing And Detecting Device Sensing Device And Transducers TEM Cell Voltage Measurement Wires And Cables |
Content Type | Text |
Resource Type | Article |
Subject | Atomic and Molecular Physics, and Optics Electrical and Electronic Engineering |
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