NDLI: Methodology for RF receiver sensitivity analysis using electromagnetic field map

Content Provider	IET Digital Library
Author	Kim, J. J. Yang, K. M. Kim, J. M. Kim, Y. J. Lee, S. Y.
Abstract	Accurate modelling of a chip is a very important factor when analysing and predicting radio-frequency (RF) receiver sensitivity. Chip modelling based on the tangential electromagnetic (EM) field from the near-field measurement just above the top surface of the chip is introduced, and a methodology utilising three-dimensional (3D) EM simulation, for predicting receiver sensitivity generated by the chip-noise of a mobile phone, is suggested. It is worth noting here that the calculation of absolute coupling values between a noise source and an antenna is possible by using the real measured data source to obtain reliable results.
Starting Page	1753
Ending Page	1755
Page Count	3
ISSN	00135194
Volume Number	50
e-ISSN	1350911X
Issue Number	Issue 23, Nov (2014)
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/el/50/23
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/10.1049/el.2014.1355
Journal	Electronics Letters
Publisher Date	2014-10-30
Access Restriction	Open
Rights Holder	© The Institution of Engineering and Technology
Subject Keyword	3D EM Simulation Antenna Chip Modelling Chip Noise Circuit Simulation Digital Circuit Design, Modelling And Testing Electromagnetic Field Integrated Circuit Modelling Integrated Circuit Noise Microwave IC Mobile Phone Mobile Radio System Near Field Measurement Noise Source Radio Receiver Radiofrequency Integrated Circuit RF Receiver Sensitivity Analysis Sensitivity Analysis Single Antenna Smart Phones Tangential Electromagnetic Field
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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