NDLI: Microwave measurements of dielectric properties - a further study to a new theoretical model for a closed cylindrical cavity dielectric resonator

Content Provider	IEEE Xplore Digital Library
Author	Jyh Sheen Chin-An Chen Yi-Hua Chen Chin-Lun Lai Zuo-Wen Hong
Copyright Year	2009
Description	Author affiliation: Department of Electronic Engineering, National Formosa University, Hu-Wei, Yun-Lin 632, Taiwan (Jyh Sheen; Zuo-Wen Hong) \|\| Department of Communication Engineering, Oriental Institute of Technology, Pan-Chiao, Taipei 220, Taiwan (Yi-Hua Chen; Chin-Lun Lai) \|\| Department of Electronic Engineering, Oriental Institute of Technology, Pan-Chiao, Taipei 220, Taiwan (Chin-An Chen)
Abstract	A low loss measurement technique for complex permittivity, using a closed cylindrical cavity resonator, is investigated. The measurements are made at the resonant frequency of the TE01.δ mode with a new modified field model, which provides a very simple and clear description of the field distribution within the resonator. The various aspects of the conductor loss are studied. The perturbation methods and their accuracies for calculating the conductor loss and the energy factor are compared with the traditional calculation methods. The improvement of the modified field model to the unmodified is justified by experimental results on dielectric constant measurements.
Starting Page	3874
Ending Page	3877
File Size	300857
Page Count	4
File Format	PDF
ISBN	9781424447534
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-03-23
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	VDE
Subject Keyword	Permittivity measurement dielectric measurements cavity resonators Dielectric resonators Conductors Frequency measurement Microwave measurements Tellurium Resonant frequency Dielectric measurements Measurement techniques Dielectric loss measurement Cavity resonators permittivity measurement
Content Type	Text
Resource Type	Article

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