NDLI: Low-cost I-V tracer for photovoltaic modules and strings

Content Provider	IEEE Xplore Digital Library
Author	Leite, V. Batista, J. Chenlo, F. Afonso, J.L.
Copyright Year	2014
Description	Author affiliation: Sch. of Technol. & Manage., Polytech. Inst. of Braganca, Braganca, Portugal (Leite, V.; Batista, J.) \|\| CIEMAT (Res. Centre for Energy, Environ. & Technol.), Madrid, Spain (Chenlo, F.) \|\| Dept. of Ind. Electron., Univ. Minho, Guimaraes, Portugal (Afonso, J.L.)
Abstract	This paper presents new developments of a robust and low-cost instrument - less than 600 € - for monitoring and processing I-V and P-V characteristics of photovoltaic (PV) modules and high voltage strings. The characteristics can be traced on an oscilloscope or using a developed a LabVIEW application. It is a simple instrument because only fundamental electronic circuits are used. The equipment consists of a flexible configuration, developed from a previous work, based on a fast varying load based on a power MOSFET. The MOSFET was controlled by means of suitable gate-source voltage control signal in order to improve the tracing of I-V and P-V characteristics on an oscilloscope. The contribution of this work includes new developments of a previous I-V tracer in order to be use with high voltage strings and a low-cost DAQ monitoring system based on two applications developed in LabVIEW - one for PV modules and the other for PV strings. On the other hand, the robustness for high voltage strings was strongly improved in view of field tests for fault diagnosis analysis. Experimental results obtained with the new instrument are presented with modules and different strings available with voltages up to 1000 volt.
Starting Page	971
Ending Page	976
File Size	1194632
Page Count	6
File Format	PDF
ISBN	9781479947492
DOI	10.1109/SPEEDAM.2014.6872078
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-06-18
Publisher Place	Italy
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Insulated gate bipolar transistors MOSFET Voltage measurement PV Modules and Strings Instruments Data acquisition Capacitors Fault Diagnosis I-V Tracer I-V and P-V Characteristics Electronic circuits LabVIEW
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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