NDLI: Quantitative Emergence -- A Refined Approach Based on Divergence Measures

Content Provider	IEEE Xplore Digital Library
Author	Fisch, D. Jänicke, M. Sick, B. Müller-Schloer, C.
Copyright Year	2010
Abstract	The article addresses the phenomenon of emergence from a technical viewpoint. A technical system exhibits emergence when it has certain kinds of properties or qualities that are irreducible in the sense that they are not traceable to the constituent parts of the system. In particular, we show how emergence in technical systems can be detected and measured gradually using techniques from the field of probability theory and information theory. To detect or measure emergence we observe the system and extract characteristic attributes from those observations. As an extension of earlier work in the field, we propose emergence measures that are well-suited for continuous attributes (or hybrid attribute sets) using either non-parametric or model-based probability density estimation techniques. We also replace the known entropy-based emergence measures by divergence measures for probability densities (e.g., the Kullback-Leibler divergence or the Hellinger distance). We discuss advantages and drawbacks of these measures by means of some simulation experiments using artificial data sets and a real-world data set from the field of intrusion detection.
Starting Page	94
Ending Page	103
File Size	2061205
Page Count	10
File Format	PDF
ISBN	9781424485376
DOI	10.1109/SASO.2010.31
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-09-27
Publisher Place	Hungary
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Q measurement Density measurement Atmospheric measurements organic computing intelligent technical systems Gaussian distribution Particle measurements Entropy Time measurement quantitative emergence
Content Type	Text
Resource Type	Article

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